Brand:SIGLENT鼎阳科技
he SDS5000X HD series is Siglent's latest addition to its 8-channel oscilloscope lineup, delivering up to 1 GHz bandwidth, a 5 GSa/s sample rate, and 2.5 Gpts of memory depth. It supports three-phase power analysis, automated double-pulse parameter testi
Modern electronic systems contain a variety of chips and modules. Signals from different circuit blocks can affect one another during initialization and operation. Power-up timing tests confirm that each module's signals appear at the correct time, preventing signal conflicts and interference and keeping the system running properly. In a communication system, for example, improper power-up sequencing of the transmit and receive modules can cause data transmission errors.
As technology advances, circuit complexity keeps increasing, which brings new challenges to power-up timing tests. The SDS5000X HD captures the power-up process of all relevant signals in a single acquisition — saving measurement time, improving efficiency, and reducing the errors that repeated measurements introduce. For complex circuits with more than eight power rails, the entire measurement can be completed in one capture.
Using an 8-channel oscilloscope for three-phase power analysis, you can connect to all three phases at once and measure the three-phase voltage and current signals synchronously. This gives you accurate real-time waveforms and parameters for every phase, so you can directly observe and compare the phase relationships of the three-phase signals and confirm phase balance.
With the Fast Fourier Transform (FFT) function, the multi-channel oscilloscope performs harmonic analysis on the three-phase voltage and current signals.
With the optional three-phase power analysis package, you can test the vector diagram of three-phase motors, evaluate power quality, and perform efficiency analysis.
Siglent's latest 8-channel oscilloscope and optically isolated probes complete the last piece of the wide-bandgap semiconductor test puzzle.
With a rise time in the picosecond range, the SDS5000X HD captures the fast-changing waveforms of silicon carbide (SiC) and gallium nitride (GaN) devices, and analyzes the transient changes in voltage and current during switching along with the switching characteristics.
By observing signal shape, overshoot, ringing, and other characteristics, you can analyze signal integrity and optimize circuit design.
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